IEEE/ASME J. Microelectromechanical Systems

IEEE/ASME J. Microelectromechanical Systems

Home work # 1

EECS 290 G

Name: Nadia Al-Badrawy

Q 1

IEEE/ASME J. Microelectromechanical Systems

  1. Call lettersTK 153 J6 v. 8 no.2 ENG display June 99
  2. The journal locationIn the back area of the library, it is on the 5th shelf on the wall,

in the first raw, the color is light blue.

  1. The bound back location on the second floor, coming from the main entrance its on the 5th

Shelf in the second row and it’s the 4th book

  1. The journal editor Professor Richard S. Muller
  2. The Berkeley member Professor Roger Howe

Sensors and Actuators

1. Call lettersTJ 223 T7 S44 v. 75 no.3 ENGI display

  1. The journal locationThe same shelf as above (the ones on the wall in the back area),

its on the 3rd shelf in the 2 raw, the 4th book color orange

  1. The bound back location On the second flour the on the right when coming from main

entrance, it’s in the 4th row.

  1. The journal editor S. Middelhoek (Delft, Netherlands)
  2. The Berkeley member Professor Roger Howe

Q 2

Biomedical Micro devices

  1. Call lettersR 856 AL B 497 v. 1 no 2 ENGI display
  2. The journal location In the first study area on the right, in the magazine area

its on the shelf at the right hand when entering this area

2 end raw last magazine.

  1. The bound back location It is on the last shelf from the R area next to the back area

of the library.

  1. The journal editor Professor Mauro Ferrari
  2. The Berkeley member Professor Albert Pisano, Richard Mathies.

Q 3

  1. Professor Kahlil Najafi

Ph. D. in electrical engineering from the University of Michigan Ann Arbor, and he is now a faculty member at the same school.

  1. Professor Bernhard Boser

Ph. D. in electrical engineering from Stanford University, and he is now a faculty member at the University of California/ Berkeley.

  1. Professor Al Pisano

Ph. D. in mechanical engineering from Columbia University, he is now working for DARPA.

  1. Professor Roger Howe

Ph. D. in electrical engineering from the University of California/ Berkeley, he is now a faculty member at the University of California/Berkeley.

Q 4

Paper by L. Lin, A. Pisano, and R. Howe, “A micro strain gauge with mechanical amplifier “

J. Microelectromech. Syst., vol. 6 pp. 313-321, Dec. 1997.

In this paper , a passive micro strain gauge with a mechanical amplifier has been designed, and tested. The mechanical amplifier provides a high gain such that residual strain in thin films can directly measured under an optical microscope. It is shown that a very fine resolution of 0.001% strain readouts can be achieved. Beam theories have been used to analyze the strain gauge with a mechanical amplifier, and the results were verified by a finite-element analysis.

Q 5

-Microfabricated structures for the in situ measurement of residual stress,

Young’s and ultimate strain of thin films, by M.G. Allen, R. Howe., in the Applied Phys. Lett. vol. 51, pp.241-243, 1987.

-Novel Microstructures for the in situ measurement of mechanical properties of thin films,

by M. Mehregany and R. Howe, in the J. of Appl. Phys., vol.62, no. 9 pp. 3579-3584, 1987

Q 6

The prefer to use the desk in the north west side of the library

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