Home work # 1
EECS 290 G
Name: Nadia Al-Badrawy
Q 1
IEEE/ASME J. Microelectromechanical Systems
- Call lettersTK 153 J6 v. 8 no.2 ENG display June 99
- The journal locationIn the back area of the library, it is on the 5th shelf on the wall,
in the first raw, the color is light blue.
- The bound back location on the second floor, coming from the main entrance its on the 5th
Shelf in the second row and it’s the 4th book
- The journal editor Professor Richard S. Muller
- The Berkeley member Professor Roger Howe
Sensors and Actuators
1. Call lettersTJ 223 T7 S44 v. 75 no.3 ENGI display
- The journal locationThe same shelf as above (the ones on the wall in the back area),
its on the 3rd shelf in the 2 raw, the 4th book color orange
- The bound back location On the second flour the on the right when coming from main
entrance, it’s in the 4th row.
- The journal editor S. Middelhoek (Delft, Netherlands)
- The Berkeley member Professor Roger Howe
Q 2
Biomedical Micro devices
- Call lettersR 856 AL B 497 v. 1 no 2 ENGI display
- The journal location In the first study area on the right, in the magazine area
its on the shelf at the right hand when entering this area
2 end raw last magazine.
- The bound back location It is on the last shelf from the R area next to the back area
of the library.
- The journal editor Professor Mauro Ferrari
- The Berkeley member Professor Albert Pisano, Richard Mathies.
Q 3
- Professor Kahlil Najafi
Ph. D. in electrical engineering from the University of Michigan Ann Arbor, and he is now a faculty member at the same school.
- Professor Bernhard Boser
Ph. D. in electrical engineering from Stanford University, and he is now a faculty member at the University of California/ Berkeley.
- Professor Al Pisano
Ph. D. in mechanical engineering from Columbia University, he is now working for DARPA.
- Professor Roger Howe
Ph. D. in electrical engineering from the University of California/ Berkeley, he is now a faculty member at the University of California/Berkeley.
Q 4
Paper by L. Lin, A. Pisano, and R. Howe, “A micro strain gauge with mechanical amplifier “
J. Microelectromech. Syst., vol. 6 pp. 313-321, Dec. 1997.
In this paper , a passive micro strain gauge with a mechanical amplifier has been designed, and tested. The mechanical amplifier provides a high gain such that residual strain in thin films can directly measured under an optical microscope. It is shown that a very fine resolution of 0.001% strain readouts can be achieved. Beam theories have been used to analyze the strain gauge with a mechanical amplifier, and the results were verified by a finite-element analysis.
Q 5
-Microfabricated structures for the in situ measurement of residual stress,
Young’s and ultimate strain of thin films, by M.G. Allen, R. Howe., in the Applied Phys. Lett. vol. 51, pp.241-243, 1987.
-Novel Microstructures for the in situ measurement of mechanical properties of thin films,
by M. Mehregany and R. Howe, in the J. of Appl. Phys., vol.62, no. 9 pp. 3579-3584, 1987
Q 6
The prefer to use the desk in the north west side of the library