TATA INSTITUTE OF FUNDAMENTAL RESEARCH

Homi Bhabha Road, Colaba, Mumbai – 400 005.

A Deemed University

Telephone : +91-22-2278 2316/2886/2887/2888 Email :

Purchase Fax : +91-22-2280 4566 :

Website : www.tifr.res.in :

:

PUBLIC TENDER NO. : TFR/PD/IC9-001/PUB

DUE DATE : 05.06.2009

TENDER FEE : Rs. 500/-

COST OF TENDER : Approx. Rs.100 lakhs

TYPE OF TENDER : TWO PART

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DESCRIPTION OF MATERIAL

Atomic Force Microscope
As per our technical specifications … 1 No.

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Closing time and date : 13.00 Hours on 05.06.2009

Tender will be open at : 14.00 Hours on 05.06.2009

Only Technical Bid Part to be submitted within the due date and time.

Please see attached sheet for conditions of tender.

P. S. MURTHY

Purchase Officer


TATA INSTITUTE OF FUNDAMENTAL RESEARCH

Homi Bhabha Road, Colaba, Mumbai – 400 005

(A DEEMED UNIVERSITY)

Terms and Conditions

1.  Offer should be on the basis of Ex-works, duly packed airworthy.

2.  Tender Forms can be obtained from the Purchase Section on payment of the tender fees (non-refundable) of Rs.500/- by cash/Demand Draft in favour of Tata Institute of Fundamental Research, Mumbai, to the cashier, Accounts Department on any working day between 11.00 a.m. to 12.30 p.m. and 1.00 p.m. to 3.00 p.m.

3.  The firm who wishes to download the specifications, terms and conditions may do so. While submitting the quotation, a DD of Rs.500/- for each tender drawn in favour of Tata Institute of Fundamental Research, Mumbai may please be enclosed along with Technical Bid. Foreign Suppliers prepare advance cheque for US$100/-.

4.  Quotations must be valid for a period of 90 days from the date of opening of the commercial bid.

5.  Technical bids shall be submitted in sealed envelopes duly superscribed with the Tender Enquiry Number and the due date in bold letters addressed to the Purchase Officer, Tata Institute of Fundamental Research, Homi Bhabha Road, Colaba, Mumbai - 400 005. Tenders sent by hand delivery may be deposited in the Tender Box kept at the Main Gate after obtaining stamp, date and signature of the Security Officer before 1300 hrs on the due date specified. Technical bids will be opened in the presence of attending tenderers on the due date at 14.00 hrs on the same day.

6.  After scrutiny of Technical Bids, commercial bid will be invited only from the short listed suppliers.

7.  Tenders containing correction, overwriting will not be considered.

8.  Tenders which do not comply with the above conditions are liable to be rejected.

9.  If equipment offered is to be imported, arrangements for import will be made by us.

10.  The Institute shall be under no obligation to accept the lowest or any other tender received in response to this tender notice and shall be entitled to reject any tender without assigning any reason whatsoever.

11.  We reserve the right to place the order for part/reduced quantity than what is specified in the tender.

PURCHASE OFFICER


Ref.: TFR/PD/IC9-001/PUB

Atomic Force Microscope mounted on an Inverted Microscope

Operational Modes

Imaging modes:

Contact; Constant force, Constant height; Lateral Force; Non-contact; AC (intermittent contact); Phase; Dual AC or simultaneous multiple resonance frequency mode; Magnetic (MFM); Electric Force (EFM); Surface potential (Scanning Kelvin Probe microscopy); Piezo Force Microscopy (PFM); HV-PFM (with the PFM module) and Conductive AFM imaging, Oscillating current Split tip mode for liquid imaging and soft sample imaging.

Non-imaging modes:

Force; Force/Distance spectroscopy; Force Volume Mapping; Nanolithography and Nanomanipulation; Current/Voltage (I-V) spectroscopy; and Switching Spectroscopy.

Scanning system – Closed loop operation with position sensors in 3 axes

·  XY scanner separate from Z scanner to eliminate “bowing” effect in images commonly seen in Piezo tube-based AFM systems.

·  X&Y: travel range 90µm. Closed loop position control with sensor noise <0.6nm absolute deviation in a 0.1 Hz-1 kHz bandwidth and sensor nonlinearity <0.5% at full scan.

·  Z: travel range >15µm with closed loop sensor control. Sensor noise <0.3nm in a 1kHz BW and sensor non-linearity less than 0.2% at full scan: Z vertical noise floor: <0.03nm.

Head/Optical Lever Detection

•Infrared SLD (860nm) to eliminate crosstalk problems with epi- and transmission- fluorescence measurements.

•Use of standard commercial AFM cantilevers.

Stage

•Micrometer controlled sample translation stage with 10-mm (dia) range in the x-y plane.

•Optional motorized sample translation stage with a range of ~8mm in the x and y directions.

Multiple Spring Constant Calibration Methods

•Quick, push-button non-destructive determination of cantilever spring constant using thermal noise and Sader hydrodynamic methods.

•Integrated mechanical micro-manipulation system for attaching particles to the cantilever for force measurements and for Cleveland added mass spring constant calibration method.

Built-in Nanolithography and Manipulation

•The built-in cantilever control for lithography and manipulation applications without the need for extra hardware or software or compiling.

3D Image Rendering from within the software environment

Inverted Optical Microscope Model should be specified. Please also quote necessary Inverted Microscope accessories.

Following options may also be quoted

Humidity Cell

Conducting AFM module

Magnetically Actuated Cantilever Drive

Variable Field Module

PFM: Piezo Force Module

Extended Head