Proceedings of Scanning Probe Microscopy-2003.
Nizhny Novgorod. March 2 - March 5. 2003.
CONTENTS
ORAL SESSIONS
A.V.Latyshev, D.V.Sheglov, E.E.Rodyakina, S.S.Kosolobov, D.A.Nasimov, A.L.Aseev. Institute of Semiconductor Physics SB RAS, Novosibirsk, Russia / pdf
Ambient AFM observation of strained SiGe nanoislands embedded in Ge/Si structures on the structure cross-sections.
A.N.Titkov1, M.S.Dunaevskii1, A.V.Ankudinov1, Z.F.Krasilnik2, D.N.Lobanov2, A.V.Novikov2, R.Laiho3. 1Ioffe Physico-Technical Institute RAS, St.Petersburg, Russia. 2Institute for Physics of Microstructures RAS, N.Novgorod, Russia. 3University of Turku, Turku, Finland / pdf
Investigation of the electrical potential distribution on the test structures, imitating the integrated circuit elements by Scanning Electrostatic Force Microscopy (Kelvin mode).
G.A.Maximov, D.O.Filatov, A.V.Kruglov, D.A.Antonov, А.N.Kiselev, D.E.Nikolitchev. Research and Educational Center for Physics of the Solid State Nanostructures, Nizhny Novgorod State University , Russia / pdf
Initial stages of overgrowth of GaInP on InP quantum dots.
M.-E.Pistol, M. K.-J.Johanson, U.Håkansson, M.Holm, T.Sass, J.Persson, J. Johansson, C. Pryor, C. Thelander, L. Montelius, L.Samuelson. Solid State Physics/Nanometer Structure Consortium, Lund University, Lund, Sweden. Osram Opto Semiconductors GmbH, Regensburg, Germany. Optical Science and Technology Center, University of Iowa, Iowa, USA / pdf
Many particle non-equilibrium effects in the scanning tunneling spectroscopy of impurity atoms and orbital states.
P.I.Arseyev1, N.S.Maslova2, V.I.Panov2, S.V.Savinov2, C.Van Haesendonck3 . 1Lebedev Physical Institute, Russian Academy of Sciences, Moscow, Russia. 2Department of Physics, Moscow State University, Moscow, Russia. 3Laboratorium voor Vaste-Stoffysica en Magnetisme, Katholieke Universiteit Leuven, Belgium. / pdf
Measuring local elastic properties ofcell surfaces and soft materials in liquid by atomic force microscopy.
N.I.Nurgazizov, A.A.Bukharaev, A.A.Mozhanova, D.V.Ovchinnikov. Zavoisky Physical Technical Institute RAS, Kazan, Russia / pdf
Nanostructure Characterization using Low Temperature Scanning Tunneling Microscopy and Spectroscopy. (Invited)
D.Fujita. Nanomaterials Laboratory, National Institute for Materials Science, Tsukuba, Ibaraki, Japan / pdf
STM study of magic clusters of group III metals on Si(111) and Si(100).
V.G.Kotlyar1, A.V.Zotov1, A.A.Saranin1,2, T.V.Kasyanova1,2, M.A.Cherevik1, I.V.Pisarenko1,2 V.G.Lifshits1,21Institute of Automation & Control Processes RAS,Vladivostok, Russia. 2Far Eastern State University, Vladivostok, Russia. / pdf
Microscopic study of thin films of Ni-filled carbon nanocapsules.
V.D.Frolov, E.V.Zavedeev, S.M.Pimenov, V.I.Konov, S.Tomita, M.Fujii, S.Hayashi. General Physics Institute, Moscow, Russia. Department of Electrical and Electronics Engineering, Kobe University, Kobe, Japan / pdf
Real 2D frustrated Ising systems. (Practical realizations of a 2D frustrated Ising Model).
L.Ottaviano1, B.Ressel2,3, C.DiTeodoro1, G.Profeta1, S.Santucci1, V.Cháb3, K.C.Prince2. [1]Unità INFM and Dipartimento di Fisica Università degli Studi dell'Aquila, L'Aquila, Italy. [2]Sincrotrone Trieste, Basovizza-Trieste, Italy. [3]Institute of Physics of the Academy of Science of the Czech Republic, Prague, Czech Republic. / pdf
Scanning tunnelling spectroscopy of electron transfer processes at surfaces. (Invited)
R.Berndt. Christian-Albrechts-Universität. Kiel, Germany / pdf
Nanotomography for surface layers by SPM.
S.A.Chizhik1,2, D.I.Shasholko3, V.V.Chikunov1,3 . 1A.V.Lykov Heat and Mass Transfer Institute NAS of Belarus, Minsk, Belarus. 2Metal-Polymer Research Institute NAS of Belarus, Gomel, Belarus. 3Microtestmachines Co., Gomel, Belarus / pdf
CuI growth on copper surface under molecular iodine action: influence of the surface anisotropy in iodine monolayer.
B.V.Andryushechkin, K.N.Eltsov, V.M.Shevlyuga. Center for Natural Science Research, A.M.Prokhorov General Physics Institute RAS, Moscow, Russia / pdf
SPM Study of Patterned Magnetic Nanostructures for High-Density Data Storage.
N.I.Polushkin, B.A.Gribkov, V.L.Mironov, A.M.Alexeev, A.F.Popkov, J.Wittborn, K.V.Rao. Institute for Physics of Microstructures of RAS, N.Novgorod, Russia. State Research Institute of Physical Problems, NT-MDT, Moscow, Russia. Department of Materials Science, Royal Institute of TechnologyStockholm, Sweden. / pdf
Ferroelectric nanodomain structures in LiNbO3 and LiTaO3: investigation by scanning probe microscopy.
V.Ya.Shur, E.V.Nikolaeva, E.I.Shishkin. Ural State University, Ekaterinburg, Russia / pdf
Open Experimental Internet Practical Studies in Nanoscopy.
A.V.Bolshakova, A.S.Filonov, M.O.Gallyamov, D.Yu.Gavrilko, E.V.Dubrovin, O.I.Kiselyova, A.M.Lomonosov, E.B.Meshkov, I.V.Yaminsky. Moscow State University, Advanced Technologies Center, Moscow, Russia / pdf
Surface polaritons in the near-field optics.
M.N.Libenson, G.A.Martsinovsky. S.I.Vavilov State Optical Institute / pdf
Near-field optical imaging of carrier dynamics in silicon with sub-wavelength resolution.
P.Tománek, M.Benešová, P.Dobis, D.Košťálová, L.Grmela, Satoshi Kawata. Brno University of Technology, Faculty of Electrical Engineering and Communication, Brno, Czech Republic. Osaka University and Riken, Japan / pdf
Near-field scanning optical microscopy of single nano-objects. (Invited)
M.Brun, A.Drezet, S.Huant, J.C.Woehl. Université Joseph Fourier Grenoble et CNRS, Saint Martin d’Hères, France / pdf
Photochemically supported migration and transfer in the optical near field.
P.KARAGEORGIEV1, B.Stiller1, O.Henneberg1, A.Natansohn2, L.Brehmer1 . 1Institute of physics, University of PotsdamPotsdam, Germany. 2Department of chemistry, Queen’s University Kingston, Ontario, Canada / pdf
Nanoproccessing in the Near-Field of Atomic Force Microscope Tip by Femtosecond Laser Pulses.
A.Kirsanov, A.Kiselev, A.Stepanov, N.Polushkin. Institute of Applied Physics RAS. Institute for Physics of Microstructures RAS, Nizhny Novgorod, Russia / pdf
Atomic and electronic properties of surface nanoscaled structures of HOPG.
M.V.Grishin, F.I.Dalidchik, S.A.Kovalevskii. Institute of Chemical Physics RAS, Moscow, Russia / pdf
Trends of Scanning probe microscopy.
V.Bykov. NT-MDT Co. Moscow, Russia. / pdf
Influence of nanostandard properties on calibration procedures of SPMs.
T.Dziomba, W.Häßler-Grohne, H.Bosse, H.Danzebrink, L.Koenders, G.Wilkening. Physikalisch-Technische Bundesanstalt, Braunschweig, Germany / pdf
The physical-chemical model of the tip-induced oxidation process on thin metal films, factors influencing and improvement of the lateral resolution.
S.V.Lemeshko, S.A.Saunin, V.M.Roschin, A.Y.Yalovenko. NT-MDT, State research institute of physical problem, Moscow, Zelenograd, RussiA / pdf
An Application of Atomic Force Microscopy to Measure the Spring Constant of Single Antigen-antibody Complex.
L.A.Chtcheglova, G.T.Shubeita, S.K.Sekatskii, G.Dietler. Institut de Physique de la Matière Condensée, University of Lausanne, Switzerland / pdf
Atomic Force Microscopy in Applied Biological Research.
B.N.Zaitsev. State Research Center of Virology&Biotechnology "Vector", Koltsovo, Novosibirsk region, Russia / pdf
POSTER SESSION
1. SPM investigations of semiconductor structuresAFM investigation of the silicon micro structure steep walls created by reactive ion milling.
S.Saunin. S. Leesment. NT-MDT, State research institute of physical problem; Moscow Institute of Electronic Engineering, Moscow, Zelenograd, RUSSIA / pdf
STM study of Ag film initial stages growth on a GAN(0001) surface grown by MBE.
R.Z.Bakhtizin1), K.-H.Wu2), Q.-Z.Xue2), Q.-K.Xue3), T.Nagao2), T.Sakurai2) . 1)Department of Physics, Bashkir State University, Ufa, Russia. 2)Institute for Materials Research, Tohoku University, Sendai, Japan. 3)Institute of Physics, Chinese Academy of Sciences, Beijing, China / pdf
Cross-sectional AFM of GaAs-based multilayer heterostructure with thin AlAs marks.
Yu.N.Drozdov, V.M.Danil’tsev, N.V.Vostokov, G.L.Pakhomov, V.I.Shashkin. Institute for Physics of Microstructures RAS, N. Novgorod, Russia / pdf
Charging of single InAs quantum dots on insulator surface.
M.S.Dunaevskii, A.N.Titkov, J.J.Grob, R.Laiho. Ioffe Physico-Technical Institute, St.Petersburg, Russia. L.Pastoire University, Strasbourg, France. Wihuri Laboratory, Turku University, Finland / pdf
AFM investigation of the buried InAs/GaAs quantum dots with in situ monitoring of etching process by photoelectric and hotoluminescence spectroscopy.
I.A.Karpovich, A.P.Gorshkov, A.V.Zdoroveishev, D.O.Filatov, R.N.Skvortsov. N.I.Lobachevsky State University of Nizhny Novgorod, N. Novgorod, Russia / pdf
Surface micromorphology of silicon on sapphire layers after X-ray irradiation.
A.N.Kiselev, G.A.Maximov, V.A.Perevoshikov, V.D.Skupov, D.O.Filatov. N.I.Lobachevsky State University of Nizhny Novgorod, N. Novgorod, Russia / pdf
Morphology of a surface, electronic structure and properties ion - implanted and structural – non-uniform of amorphous silicon
A.V.Nezhdanov, L.A.Meduncev, A.I.Mashin, V.G.Shengurov, A.F.Khokhlov. N.I.Lobachevsky State University of Nizhny Novgorod, N. Novgorod, Russia / pdf
SPM study of epitaxial layers of silicon on sapphire.
G.A.Maximov, D.A.Pavlov, S.P.Svetlov, A.F.Khokhlov, V.Yu.Chalkov, V.G.Shengurov, P.A.Shilyaev. N.I.Lobachevsky State University of Nizhny Novgorod, N. Novgorod, Russia / pdf
Scanning Probe Microscopic Study of Silicon Nanostructure Inclusions in Amorphous Layer after Ne+ Implantation.
M.Yu.Lebedev, A.A.Ezhevskiy, G.A.Maksimov, A.F.Khokhlov. N.I.Lobachevsky State University of Nizhny Novgorod, N. Novgorod, Russia / pdf
2. SPM investigation and modification of solid-state surface
STM study of magnetic granular thin films CoFe-Ag, Co-Ag, Co-Cu, CoFe-HfO2 and CoFe-Al2O3.
G.V.Bondarkova, A.F.Kravets, V.I.Silantiev. Institute of Magnetism NAS of Ukraine, Kyiv, Ukraine / pdf
Investigation of conductive properties of micro- and nanowires using scanning probe microscopy.
A.A.Bukharaev, P.A.Borodin, D.A.Biziaev. Zavoisky Physical Technical Institute RAS, Kazan, Russia / pdf
SPM analysis of heterogeneity in tribolayers of hard materials.
V.V.Chikunov1,2, Zhuang Yan3, S.V.Korotkevich3, S.A.Chizhik2 . 1Microtestmachines Co., Gomel, Belarus. 2A.V.Lykov Heat and Mass Transfer Institute NAS of Belarus, Minsk, Belarus. 3Metal-Polymer Research Institute NAS of Belarus, Gomel, Belarus. / pdf
Scanning tunneling microscopy current features near the excitation thresholds of collective states of low –dimensional structures.
E.M.Balashov, F.I.Dalidchik. Semenov Institute of Chemical Physics RAS, Moscow, Russia / pdf
Investigation of the initial stage of adsorption of oxygen on Al (111) by STM method.
M.V.Grishin, F.I.Dalidchik, S.A.Kovalevskii. Institute of Chemical Physics RAS, Moscow, Russia / pdf
Properties of metallic and semiconducting nanowires studied by TEM-SPM.
D.Erts1, B.Polyakov1. A.Lõhmus2, R.Lõhmus2, H.Olin3, J.D.Holmes4 . 1Institute of Chemical Physics, University of Latvia, Riga, Latvia. 2Institute of Physics, University of Tartu, Tartu, Estonia. 3Physics and Experimental Physics, Chalmers University of Technology, Göteborg, Sweden. 4Department of Chemistry, University College Cork, Ireland / pdf
Magnetic force microscope in an external controllable magnetic field.
L.A.Fomin, K.M.Kalach, G.M.Mikhailov, V.A.Bykov, S.A.Saunin. Institute of Microelectronics technology RAS, Moscow district, Chernogolovka, Russia. NT-MDT Co, Moscov, Russia. / pdf
The research of magnetic-contrast size-dependence in epitaxial iron nanostructures.
L.A.Fomin, I.V.Malikov, G.M.Mikhailov. Institute of Microelectronics technology RAS, Moscow district, Chernogolovka, Russia. / pdf
Investigation of ZrO2 Nanoceramics Microstructure.
O.V.Karban1, O.L.Khasanov2 . 1Physicotechnical Institute UrB of RAS, Izhevsk, Russia. 2Tomsk Polytechnic University, Tomsk, Russia / pdf
AFM investigation of Pt-doped spin-on glass thin silica films.
0A.E.Muravyev, 0S.S.Mikhailova, 1O.A.Shilova,2O.M.Kanunnikova. 0Physical-Technical Institute UrBr RAS, Izhevsk, Russia. 1Institute of Chemistry of Silicates RAS, St.-Petersburg, Russia. 2Udmurt state University, Izhevsk, Russia. / pdf
Structures surface processing for photoconverters.
A.V.Karimov, M.Mh.Agzamova, D.M.Yodgorova, N.L.Dmitruk, R.V.Konakova. Physical-Technical institute of the SCIE, Tashkent, Uzbekistan. Institute of Semiconductor Physics, National Academy of Sciences of Ukraine, Kiev, Ukraine. / pdf
Quantum-size charge systems resulting from the silicon surface modification in STM experiment.
V.M.Kornilov, A.N.Lachinov, A.Yu.Zherebov. Institute of Molecular and Crystal Physics of Ufa Research Center of RAS, Ufa, Russia / pdf
Application of AFM and XPS in measuring thickness of surface coatings for nanostructured materials.
S.F.Lomayeva, I.L.Lomayev. Physicotechnical Institute, UrBr RAS, Izhevsk, Russia / pdf
Surface morphology and optical properties of thin-film antireflection coatings for high-power semiconductor laser diodes.
A.V.Ershov, E.I.Malysheva, S.M.Nekorkin, B.N.Zvonkov, D.O.Filatov, V.V.Levichev. N.I.Lobachevsky State University of Nizhny Novgorod, Nizhny Novgorod, Russia / pdf
Investigation of strain-enhanced grain growth in nano- and microcrystalline aluminum alloys using methods of atomic-force and optical microscopy.
Yu.G.Lopatin, Makarov, A.V.Nokhrin. Science Research Physical-Technical Institute N.I.Lobachevsky State University of Nizhny Novgorod, N. Novgorod, Russia / pdf
Investigation of structure thermal stability of nano- and microcrystalline aluminum alloys using methods of atomic-force, optical and transmission electron microscopy.
Yu.G.Lopatin, Makarov, A.V.Nokhrin. Science Research Physical-Technical Institute N.I.Lobachevsky State University of Nizhny Novgorod, N. Novgorod, Russia / pdf
Correlation between surface morphology and switching characteristics of ferroelectric thin films.
V.Ya.Shur, I.S.Baturin, E.V.Nikolaeva, E.I.Shishkin, D.K.Kuznetsov. Ural State University, Ekaterinburg, Russia / pdf
Evolution of surface morphology in PZT and PLZT thin films during rapid thermal annealing.
V.Ya.Shur, E.B.Blankova, S.A.Negashev, E.A.Borisova, A.V.Barannikov, E.V.Nikolaeva, E.I.Shishkin. Ural State University, Ekaterinburg, Russia / pdf
The Investigation of Surface Machining Characterization for Single Crystal Materials by SPM.
Sun Tao, Li Jun, Yan Yongda, Xia Jiafei, Zhao Yi, Liang Yingchun, Cheng Kai, Dong Shen. Precision Engineering Research Institute, Harbin Institute of Technology, Harbin, China / pdf
Domains in micron-sized permalloy elements.
A.G.Temiryazev, V.I.Borisov, A.I.Krikunov, M.P.Tikhomirova. Institute of Radioengineering & Electronics RAS, Fryazino, Russia. / pdf
MFM study of soft magnetic samples.
A.G.Temiryazev. Institute of Radioengineering & Electronics RAS, Fryazino, Russia. / pdf
STM study of vortex system in superconductor NbSe2 in high field region.
A.Troyanovski, M.van Hecke, J.Aarts, P.Kes. Kapitza Institute for Physical Problems RAS, Moscow, Russia. Kamerlingh Onnes Laboratory, Universiteit Leiden, Leiden, The Netherlands / pdf
AFM investigations of nanometer-scale metal clusters formation on silicon surface.
S.V.Gaponov, B.A.Gribkov, V.L.Mironov, S.A.Treskov, D.G.Volgunov. Institute for Physics of Microstructures RAS, N. Novgorod, Russia / pdf
AFM investigation of irradiated rock salt crystals in high vacuum and in air.
R.Gaynutdinov, D.I.Vainshtein, A.Tolstikhina, H.W.den Hartog. A.V.Shubnikov Institute of Crystallography RAS, Moscow, Russia.State University of Groningen, The Netherlands / pdf
In situ AFM investigation of domain walls movement in triglicine sulfate crystals under influence of temperature and electric field.
A.L.Tolstikhina, R.V.Gaynutdinov, N.V.Belugina. A.V.Shubnikov Institute of Crystallography RAS, Moscow, Russia / pdf
AFM investigation of carbon nanotubes.
A.Yalovenko. Moscow State Institute of Electronic Engineering Moscow, Russia. / pdf
Self-assembly of carbon nanotubes in a conductive SnO2 matrix.
V.D.Frolov, S.I.Dolgaev, A.V.Simakin, G.A.Shafeev. General Physics Institute RAS, Moscow, Russia / pdf
Resonant surface polaritons of cylindrical three-layer waveguide in far IR-range.
M.N.Libenson, D.S.Smirnov . S.I.Vavilov State Optical Institute, Saint-Petersburg Institute of Fine Mechanics and Optics, St.-Petersburg, Russia / pdf
Fabrication of the nanodimensional elements by the near-field optical lithography method.
V.F.Dryakhlushin, A.Yu.Klimov, V.V.Rogov, N.V.Vostokov. Institute for Physics of Microstructures RAS, N. Novgorod, Russia / pdf
Study of Near-Field Emission of Semiconductor Laser.
K.P.Gaikovich, V.F.Dryakhlushin, V.V.Levichev, V.P.Mishkin . Institute for Physics of Microstructures RAS, N. Novgorod, Russia, N.I.Lobachevsky State University of Nizhny Novgorod, N.Novgorod, Russia / pdf
Microwave Subsurface Imaging of Living Tissues.
G.M.Altshuller, K.P.Gaikovich, V.L.Vaks. Institute for Physics of Microstructures RAS, N. Novgorod, Russia / pdf
Possibility of subsurface thermometry of biological media by means of near-field microwave sounding.
A.N.Reznik, N.V.Yurasova. Institute for Physics of Microstructures RAS, N. Novgorod, Russia / pdf
Fluctuating electromagnetic fields over a corrugated surface.
I.Dorofeyev, H.Fuchs, J.Jersch.)Institute for physics of microstructures RAS. )Physical institute of Muenster university, Germany / pdf
Fluctuating Near Field Microscopy.
J.Jersch, I.Dorofeyev, H.Fuchs, T.Maletzky. Physikalisches Institut, University Muenster, Muenster, Germany. Institute for Physics of Microstructures RAS, Nizhny Novgorod, Russia / pdf
Theoretical model and numerical simulation of scanning near-field optical microscopy in the collection and illumination configurations.
A.B.Evlyukhin, I.Y.Fadeeva. Vladimir State University, Vladimir, Russia / pdf
Probe radiation in near-field optical microscopy of one-layer nanostructure.
A.Evlyukhin, M.Gerke, E.Grigor'eva, I.Fadeeva. Vladimir State University, Vladimir, Russia / pdf
Investigation of correlation between the structure of the semiconductor laser diode with the spatial structure of its radiation by Scanning Near-field Optical Microscopy (NSOM) and Atomic Force Microscopy (AFM).
D.O.Filatov, G.A.Maximov, V.P.Mishkin, V.V.Levichev. Research and Educational Center for Physics of the Solid State Nanostructures N.I.Lobachevsky State University of Nizhny Novgorod, N. Novgorod, Russia / pdf
Intermode conversion in a SNOM probe.
M.I.Bakunov, S.B.Bodrov. N.I.Lobachevsky State University of Nizhny Novgorod, N. Novgorod, Russia / pdf
SNOM Lithography on positive photoresist.
I.V.Dushkin, A.V.Mezin. State research Institute of Physical Problems, NT-MDT Co., Moscow, Russia / pdf
Estimation of the transmission coefficient of the metal coated SNOM fiber probe.
I.Dushkin, A.Mesin. State research Institute of Physical Problems, NT-MDT Co., Moscow, Russia / pdf